2025 4th International Conference on Machine Vision, Automatic Identification and Detection (MVAID 2025)

Welcome to MVAID 2025 !

2025 4th International Conference on Machine Vision, Automatic Identification and Detection


It is our utmost pleasure to extend an invitation for your esteemed presence at the 4th International Conference on Machine Vision, Automatic Identification and Detection (MVAID 2025), scheduled to take place in Xi'an, China from May 23-35, 2025. MVAID 2025 aims to foster a dynamic platform for global scholars and engineers engaged in the cutting-edge domains of Machine Vision, Automatic Identification and Detection.

The forefront of the global STI mega-trend witnesses China's continuous efforts in establishing an increasingly open environment for science, technology, and innovation (STI), fostering extensive academic collaborations, and nurturing a vibrant innovation community that benefits all stakeholders. These endeavors not only contribute to globalization but also facilitate the creation of a shared future community.

The MVAID conference, held annually, aims to convene professors, researchers, scholars, and industrial pioneers from around the globe. MVAID serves as the foremost platform for presenting and exchanging past experiences, new advances, and research findings in both theoretical and industrial realms. The conference warmly welcomes contributions that foster idea exchange and rational discourse among educators and researchers worldwide. The organizing committee of the conference is delighted to extend an invitation to prospective authors for submitting their original manuscripts to MVAID 2025.

Call For Paper

Paper submission deadline

February 20, 2025


Registration Deadline

April 30, 2025


Conference Dates

May 23-25, 2025


Call For Papers

· Machine Vision

· Optical imaging

· Image capture

· Light source system

· Digital Image Processing

· Sensor

· Active Vision

· ...

· Automatic Identification and Detection Technology

· Artificial Intelligence Techniques in Automatic Identification

· Biometrics (including face recognition)

· Document Processing and Recognition

· Advanced Learning Methods

· Linear Models and Dimensionality Reduction

· Natural Language Processing and Recognition

· ...

Call For Papers

Publlication

All full paper submissions to the MVAID 2025 will be sent to at least two reviewers and evaluated based on originality, technical or research content or depth, correctness, relevance to conference, contributions, and readability. All accepted and registered papers will be published by SPIE - The International Society for Optical Engineering (ISSN: 0277-786X), which will be submitted to EI Compendex, Scopus for indexing.

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Supported By

Supported by

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